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GRAZING INCIDENCE DIFFRACTION (GID)Grazing incidence diffraction (GID) can be used to determine the phase composition of layers on a substrate. The angle of incidence is fixed so that the degree of penetration into the sample, by the X-rays, is kept constant throughout the measurement. At low angles of incidence the X-rays penetrate only the uppermost layers of a sample (micron scale). At higher angles of incidence the X-rays penetrate deeper into the sample. Hence successive layers on a sample surface can be sampled using GID. Parallel beam geometry with the scintillation detector must be used for this type of measurement. Below is an example of GID. The sample was a piece of titanium (Ti) coated with hydroxyapatite (HA). At shallow angles (lowest scan) the X-ray beam sampled the hydroxyapatite coating but at progressively higher angles of incidence the X-rays sampled the titanium substrate.
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compiled by Nicola Meller, March 2004
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